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Aug-30-11
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[English name] Resveratrol
[Product resource] Giant Knotweed Rhizom or synthesis
[Formula] C14H12O3
[Place of origin] Shaanxi Province , China
[CAS NO.] 501-36-0
[Specification] 50% 98%
[Test method] HPLC
[Product properties] Brown - white powder

[Application scope]
1 Anti-aging
2 Prevent the oxidation of low density lipoprotein, has the potential treatment of cardiovascular disease (atherosclerosis and coronary heart disease, ischemic heart disease, high blood lipid disorders and so on ) effecting.
3 Influence lipid and arachidonic acid metabolism;
4 Anti-thrombosis, platelet aggregation;
5 Inflammatory, anti-allergic effects
[Process flow] Polygonum cuspidatum ¡ú solvent extraction ¡úconcentrate ¡ú extraction ¡úhydrolysis¡ú bleaching ¡úFilter ¡úconcentrate ¡ú crystal ¡úFilter ¡ú concentrated drying.
[Solvent] Ethanol solvent, water, chloroform.


[Packing] 25KG/Paper Drum(37cmx37cmx50cm).
Jun-24-09
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Plant original: Pausinystalia yohimbe
Part used: bark
Specification: yohimbine 1%--98% test by hplc
Cas no.: 146-48-5
Molecular formula: c21h26o3íó
Molecular weight: 354.45
Melting point:241

Indications:

Yohimbe has been one of the most popular supplements for men and women for years. When ingested, the body converts it to yohimbine and assimilates it into the bloodstream. Yohimbe comes from the bark of a tree that grows primarily in west africa. Yohimbine, an alkaloid, is the primary active ingredient of yohimbe.
Similar alkaloids also play a role. High alkaline herbal yohimbe is made from the finest sources in the world.

What an awesome supplement! its popularity has been ignited not only by it's claimed effects as an aphrodisiac and hallucinogen, but also new research that shows it could be an herb with very effective antioxidant potential. Research shows it is a vasodilator, which means that it increases blood flow to the extremities and appendages.
May-03-22
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Featuring our premium wholesale body jewelry nipple barbell

- Available with two forward-facing jewel balls, CZ stones, balls, cones, dices, and more
- Made of surgical steel, titanium G23, anodized surgical steel, bioflex, gold, and rose gold PVD plated
- Sold in different lengths from12mm to 16mm. Large variety of designs and styles

Great selection of wholesale body jewelry and piercing supplies
Apr-30-10
Supplier From Shenzhen, Guangdong, China
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1200 dental ultrasonic cleaner

Dental ultrasonic cleaner features:

1.High-power ultrasonic transducer for superior cleaning effect
2.Large capacity tank for professional cleaning
3.Add heating for special cleaning demands
4.5 cycles adjustable with digital display
5.Memory function for the power failure
6.Transparent lid with blue light for view the cleaning process
7.With radiator for longer working time
8.Secure circuitry design with moisture-proof pcb a

Dental ultrasonic cleaner professional department:
Laboratory, electron workshop, glasses shop, jewelry shop, clocks and watches shop, mobilephone maintain shop, hospital dentistry, office and household articles etc.

Dental ultrasonic cleaner specifications:

Ultrasonic frequency40, 000 hz
Tank materialstainless steel sus304
Volume1, 300 ml
Time control5 cycles with digital time display
Power supplyac 220 ~ 240v, 50 hz/ac110~120v, 60hz
Ultrasonic power60 w
Heating temperature60 deg c
Packing size295*238*200mm (l*w*h)
Exterior size228*183*158mm (l*w*h)
Tank size175*145*70mm (l*w*h)
N.W.1.75 kg
G.W.2.15 kg
Dec-16-14
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1.Used in spa, medical, hotel, beauty, ect
2.Comfortable, relaxed
3.Free sample

Each pair of underwear is individually wrapped, 1pc/bag 5pcs/bag, 600pcs/ctn
109926 Medical Suppliers
Short on time? Let Medical sellers contact you.
Apr-19-22
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Cable Harness Probe Pogo Pin CH136-J for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5.3 mm at most when this probe works, although the plunger can move as far as 8 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.3 mm, its loaded force is about 57 gf, namely 2 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 8 mm
Rated Stroke: 5.3 mm
Spring Force: 57±17 gf (2 oz) at load 5.3 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Mar-31-22
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Switch Probe Pogo Pin SWP164 for Electronic Test

Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.

Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force

Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm.

As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A.
The typical maximum contact resistance of this model SWP164 is 160 m.

The materials used for the construction of switching probes are different for each component:

The barrel is made of brass. Subsequently gold plated during the galvanic plating phase.

The spring is made of gold plated music wire.

The plunger is made of Beryllium Copper, then gold and nickel plated.
The insulating sleeve is made of POM

For details of SWP164 switching probe, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 160 milliohms, maximum
Full Stroke: 5 mm
Rated Stroke: 3.3 mm
Spring Force: 130 gf (4.5 oz)
Normal Condition: Disconnecting between Plunge 1 and Plunger 2
Press down 1 mm: Continuity between Plunger 1 and Plunger 2

Materials
Contact Barrel: Brass, Au on Ni Plated
Spring: SWP, Au on Ni Plated
Plunger 1: Beryllium Copper, Au on Ni Plated
Plunger 2: Beryllium Copper, Au on Ni Plated
Insulating Sleeve: POM

Advantages of this switching probe
Reliable performance
Low cost of test
Best yield

Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs.

Company Information
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Apr-12-22
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Interface Probe Straight Metal Pin IFP-003 for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-003, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-003 interface probe is 16.33 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Apr-12-22
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Pogo Pin High-current Probe P350(300) Series for Electronic Test

Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(300). This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 70 milliohms.

The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of beryllium copper, then gold and nickel plated.

For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 24 amps, continuous
Contact Resistance: 70 milliohms, max
Full Stroke: 5.5mm
Rated Stroke: 3.6 mm
Spring Force: 340 gf at load 3.6 mm

Company Information:

Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Mar-03-22
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Battery Contact Probe Test Pogo Pin BIP39 for Connector Application

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
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Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. � The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP39series of battery contact probes. The outside diameter is usually 3.89 mm � and there are some common tip styles, for example � J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 5.084 mm (200 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 2.6 mm
Rated Stroke: 1.7 mm
Spring Force: 113/ 255 gf (4/ 9 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Brass, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Apr-11-22
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High-current Probe Pogo Pin P265 Series for Electronic Test

Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.

High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.

High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P265. This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 50 milliohms.

The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated stainless steel.
The plunger is made of beryllium copper, then gold and nickel plated.

For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 24 amps, continuous
Contact Resistance: 50 milliohms, max
Full Stroke: 5.3 mm
Rated Stroke: 3.5 mm
Spring Force: 220 gf (7 oz) at load 3.5 mm

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Apr-13-22
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Interface Pin Test Probe IFP-005 for Transmitting Electrical Signals

Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.

Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-005, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.

IFP-005 interface probe is 17.8 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Apr-13-22
 Inquire Now  
Cable Harness Probe Pogo Pin CHZ199 Series for Electronic Test

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ199 harness probe we will introduce here is 1.99 mm in diameter and 33.2 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.4 mm at most when this probe works, although the plunger can move as far as 6.6 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.4 mm, its loaded force is about 133 gf, namely 4.7 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.6 mm
Rated Stroke: 4.4 mm
Spring Force: 133�?�±40 gf (4.7 oz) at load 4.4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Apr-16-22
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Wire Harness Probe Pogo Pin CHD136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of the automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHD136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 255 gf, namely 9 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7 mm
Rated Stroke: 4.6 mm
Spring Force: 255�±75 gf (9 oz) at load 4.6 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
May-11-22
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Gold-plated Probe Pogo Pin PE100(90) Series for In-circuit Test

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PE100(90) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 34 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: Diameter 1.75 mm
Full Stroke: 6.5 mm
Rated Stroke: 4.3 mm
Spring Force: 284 gf (10 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Mar-08-22
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Harness Probe Pogo Pin CHZ136-H(8.4) for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ136 harness probe we will introduce here is 1.36 mm in diameter and 33.4 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of nickel-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.3 mm at most when this probe works, although the plunger can move as far as 6.4 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.3 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating:   3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 113 ±33 gf (4 oz) @ load 4.3 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Ni Plated
Spring: SW-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
�?� 
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Mar-27-22

Harness Probe Pogo Pin Ch136

$0.10 - $50
MOQ: Not Specified
 Inquire Now  
Harness Probe Pogo Pin CH136 Series for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 2.67�?� mm at most when this probe works, although the plunger can move as far as 4�?� mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 2.67�?� mm, its loaded force is about 185�?� gf, namely 6.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications

Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.67 mm
Spring Force: 185 ±55 gf (6.5 oz) at   load 2.67 mm
Materials (plated)

Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.
�?� 
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Mar-27-22
 Inquire Now  
Cable Harness Probe Pogo Pin CH136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33  mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 1.67  mm at most when this probe works, although the plunger can move as far as 2.5  mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 1.67 mm, its loaded force is about 140  gf, namely 5  ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 2.5 mm
Rated Stroke: 1.67 mm
Spring Force: 140 ±40 gf (5 oz) at   load 1.67 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Apr-05-22
 Inquire Now  
Test Probe Pogo Pin PL50 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe.
For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: Diameter 0.95 mm
Full Stroke: 3.7 mm
Rated Stroke: 2.54 mm
Spring Force: 28/56/85 gf (1/2/3 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper/SK4, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Apr-06-22
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Cable Harness Contact Probe Pin CHL137 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHL137 harness probe we will introduce here is 1.37 mm in diameter and 26.7 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 100 milliohms. It is suggested the plunger be pressed at a distance of 2.8 mm at most when this probe works, although the plunger can move as far as 4.2 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 2.8 mm, its loaded force is about 100 gf, namely 3.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 100 milliohms
Full Stroke: 4.2 mm
Rated Stroke: 2.8 mm
Spring Force: 100 ±30 gf (3.5 oz) at load 2.8 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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