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Wire Harness Probe Test Pogo Pin Chd136

Supplier From China
Apr-16-22

Wire Harness Probe Pogo Pin CHD136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of the automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHD136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 255 gf, namely 9 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7 mm
Rated Stroke: 4.6 mm
Spring Force: 255�±75 gf (9 oz) at load 4.6 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Price and Minimum Quantity

Price: $0.1 - $50
MOQ: Not Specified

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Cable Harness Probe Pogo Pin CH136 for the Tests of Automotive Industry

Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33  mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 1.67  mm at most when this probe works, although the plunger can move as far as 2.5  mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 1.67 mm, its loaded force is about 140  gf, namely 5  ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 2.5 mm
Rated Stroke: 1.67 mm
Spring Force: 140 ±40 gf (5 oz) at   load 1.67 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Apr-13-22
 
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Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.

The CHZ199 harness probe we will introduce here is 1.99 mm in diameter and 33.2 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.

This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.4 mm at most when this probe works, although the plunger can move as far as 6.6 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.4 mm, its loaded force is about 133 gf, namely 4.7 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.6 mm
Rated Stroke: 4.4 mm
Spring Force: 133�?�±40 gf (4.7 oz) at load 4.4 mm

Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

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