Switch Probe Pogo Pin SWP164 for Electronic Test

Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.

Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force

Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm.

As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A.
The typical maximum contact resistance of this model SWP164 is 160 m.

The materials used for the construction of switching probes are different for each component:

The barrel is made of brass. Subsequently gold plated during the galvanic plating phase.

The spring is made of gold plated music wire.

The plunger is made of Beryllium Copper, then gold and nickel plated.
The insulating sleeve is made of POM

For details of SWP164 switching probe, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 160 milliohms, maximum
Full Stroke: 5 mm
Rated Stroke: 3.3 mm
Spring Force: 130 gf (4.5 oz)
Normal Condition: Disconnecting between Plunge 1 and Plunger 2
Press down 1 mm: Continuity between Plunger 1 and Plunger 2

Materials
Contact Barrel: Brass, Au on Ni Plated
Spring: SWP, Au on Ni Plated
Plunger 1: Beryllium Copper, Au on Ni Plated
Plunger 2: Beryllium Copper, Au on Ni Plated
Insulating Sleeve: POM

Advantages of this switching probe
Reliable performance
Low cost of test
Best yield

Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs.

Company Information
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.