Switch Probe Pogo Pin SWP298 Series for Electronic Test
Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.Â
Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force
FLAT BOTTOM POGOPIN
Flat-Bottom POGOPIN, Multi-Layer Steps Of Outer Diameter Can Be Formed In One Go
Cam Automatic Car Once Formed, Surface Treatment: Can Be Gold Plated. With Anti-Corrosion, Small Size, High Current , Can Be Processed Custom. For Wearable Devices, Notebooks, Medical Electronics Spring Needle Antenna Thimble Charging Probe.
Material: C3604 Size: Customizable
Stretch: 72g�±20g (Customizable) Current: 1-30A Customizable)
Ningbo Yi Yi Precision Technology Co., Ltd. is a professional non-standard high precision hardware parts� manufacturer, our main products includes high precision turned parts/CNC, hexagonal pillar, pogopin linker (pogo pin connector),standard/non-standard fasteners, stainless steel screws, stamping, cold heading bolts/cold heading nuts,stainless steel crank shaft, die casting/casting parts, lock accessories/cylinder.
Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.
Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force
Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm.
As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A.
The typical maximum contact resistance of this model SWP164 is 160 m.
The materials used for the construction of switching probes are different for each component:
The barrel is made of brass. Subsequently gold plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of Beryllium Copper, then gold and nickel plated.
The insulating sleeve is made of POM
For details of SWP164 switching probe, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 160 milliohms, maximum
Full Stroke: 5 mm
Rated Stroke: 3.3 mm
Spring Force: 130 gf (4.5 oz)
Normal Condition: Disconnecting between Plunge 1 and Plunger 2
Press down 1 mm: Continuity between Plunger 1 and Plunger 2
Materials
Contact Barrel: Brass, Au on Ni Plated
Spring: SWP, Au on Ni Plated
Plunger 1: Beryllium Copper, Au on Ni Plated
Plunger 2: Beryllium Copper, Au on Ni Plated
Insulating Sleeve: POM
Advantages of this switching probe
Reliable performance
Low cost of test
Best yield
Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs.
Company Information
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Switch Probe Test Pogo Pin SWP137 Series for Connection
Switching Probes is a kind of functional probes.They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.
Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force
Below switching probe we will introduce is SWP137. Its diameter is 1.37 mm and total length is 30.75 mm.
As usual, switching probes do not entail very high currents, and this model SWP137 can work with the current up to 3 A.
The typical maximum contact resistance of this model SWP137 is 80 m .
The materials used for the construction of switching probes are different for each component:
The barrel  is made of brass. Subsequently nickel  plated during the galvanic plating phase.
probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Welcome to browse our website  and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Gold Plated Switch Probe Test Pogo Pin SWP260 Series for Connection
Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.
Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force
Below switching probe we will introduce i
As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A. SWP260 Â is 50 m
The materials used for the construction of switching probes are different for each component:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Welcome to browse our website  and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
1459 Switch Probe Pogo Pin Swp298 Suppliers
Short on time? Let Switch Probe Pogo Pin Swp298 sellers contact you.
Harness Probe Pogo Pin CH136 Series for the Tests of Automotive Industry
Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 2.67�?� mm at most when this probe works, although the plunger can move as far as 4�?� mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 2.67�?� mm, its loaded force is about 185�?� gf, namely 6.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.67 mm
Spring Force: 185 ±55 gf (6.5 oz) at  load 2.67 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Welcome to browse our website and download any catalogs of our products.
�?Ã?Â
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
Product Description
Product Name2020 Premium LCD digital non-contact IR infrared thermometer for adults/kids
Measurement modeForehead mode
Effective distance5-10cm
Response time0.5s
Accuracy for human body 0./0.4
Working condition16 - 35 (50 - 104), RH85%
CertificateCE FDA
MaterialABS
Battery type3.0V(AAA*2)
1. Non-Contact Design, Safe and more hygienic to use.
2. Quick to get data for just 1 or 2 second, smart and convenient.
3. Users can quickly get measurement results after positioning properly the temperature probe in the forehead.
4. Tri-color back light, display green, yellow & red with fever alarm function.
5. Memory function: Memory recall of 50 reading.
6. Switching between Fahrenheit and Celsius.
LOOKING FOR BUYERS FROM WORLDWIDE.
CONTACT : MR Paul
Test Probe Pogo Pin PL50 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: Diameter 0.95 mm
Full Stroke: 3.7 mm
Rated Stroke: 2.54 mm
Spring Force: 28/56/85 gf (1/2/3 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin High-current Probe P350(300) Series for Electronic Test
Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.
High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.
High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P350(300). This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 70 milliohms.
The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of beryllium copper, then gold and nickel plated.
For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 24 amps, continuous
Contact Resistance: 70 milliohms, max
Full Stroke: 5.5mm
Rated Stroke: 3.6 mm
Spring Force: 340 gf at load 3.6 mm
Company Information:
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Pogo Pin SCPC035 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC035 we will introduce is 0.35 mm in barrel diameter and 7.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2.5 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 18 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel Phosphor Bronze, Au on Ni Plated
Bottom Plunger Beryllium Copper, Au on Ni Plated
Top Plunger Beryllium Copper, Au on Ni Plated
Spring SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating 2.5 amps
Contact Resistance 100 milliohms max
Bandwidth 5.8 GHz at -1dB
Inductance 1MHZ at -0.01039 uH
Captance 1MHZ at 2.35287 uF
Specifications:
Full Stroke 1 mm
Rated Stroke 0.5 mm
Spring Force 18 �±5 gf at load 0.5 mm
Mechanical Life about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Test Probe Pogo Pin P166 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Rated Stroke: 5 mm
Spring Force: 500 gf (11 oz)
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Double-ended Pogo Pin SCPA085 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA085 we will introduce is 0.85 mm in barrel diameter and 5.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This double-ended pogo pin could withstand the current up to 6 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 22 gf or 31 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated
Electronic Specification:
Current Rating: 6 amps
Contact Resistance: 100 milliohms max
Bandwidth: 12.1 GHz at -1dB
Inductance: 1MHZ at -0.03212 uH
Captance: 1MHZ at 0.792734 uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 226 gf at load 0.65 mm, 319 gf at load 0.65 mm
Mechanical Life: about 200000 cycles
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin P156 Series for PCB Assembly Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQ156 series here. Its test center is 156 mil. The diameter is 2.36 mm and the total length is 33.79 mm. Various tip styles, for example, B, C, G, J, K, L, T, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 3.96 mm (156 mil)
Current Rating: 5 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: 2.75 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.32 mm
Spring Force: 113/198/255/285 gf (4/7/9/10 oz)
Company Information
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Electronic Test Probe Pogo Pin PC50 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PC50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, SW and CRW, to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: 1 mm
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 100/110/150/200 gf (3.6/4/5.4/7.2 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
High-current Probe Pogo Pin P265 Series for Electronic Test
Cable harness test probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. Their standard and requirements are higher than other series of test probes. They can be divided into screw-thread harness test probes, cable harness switch probes, non-screw-thread harness test probes, position-limited harness test probes and cable harness high-current probes, etc.
High-current probes can withstand high current and high temperature in the tests. They are mainly applied to the in-circuit test field of high temperature and high current environments.
High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a fixed schedule for mass production of P265. This probe can withstand the current up to 24 Amps. And its typical maximum contact resistance is 50 milliohms.
The materials used for the construction of this high-current test probe are different for each component:
The barrel is made of brass. Subsequently gold and nickel plated during the galvanic plating phase.
The spring is made of gold plated stainless steel.
The plunger is made of beryllium copper, then gold and nickel plated.
For details, please check parameters in below table.
Technical Specifications
Recommended
Current Rating: 24 amps, continuous
Contact Resistance: 50 milliohms, max
Full Stroke: 5.3 mm
Rated Stroke: 3.5 mm
Spring Force: 220 gf (7 oz) at load 3.5 mm
Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 112/150/198 gf (4/5.5/7 oz)
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Pogo Pin CHD136 for the Tests of Automotive Industry
Harness probes are mainly used directly or for the tests of the automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CHD136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 7 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 255 gf, namely 9 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7 mm
Rated Stroke: 4.6 mm
Spring Force: 255�±75 gf (9 oz) at load 4.6 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Pogo Pin PSICT39 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PSICT39 series here. The diameter is 0.61 mm and the total length is 19.5 mm. Various tip styles, for example, B, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 70 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.5 mm
Spring Force: 70 gf (2.5 oz) at load 2.5 mm
Materials
Receptacle: Brass, Au on Ni Plated
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
For more information, please check below catalog.
Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
In-circuit Test Probe Pogo Pin P078 Series for Printed Circuit Board Assembly
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P078-BK-346 series here. The diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, BK, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 200 gf (7 oz) at load 4.6 mm
Materials
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: SK4, Au on Ni Plated
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductive Reactance: 1MHZ at -0.05996 uH
Capacitive Reactance: 1MHZ at 0.425647 uF
Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20 6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
1459 Switch Probe Pogo Pin Swp298 Suppliers
Short on time? Let Switch Probe Pogo Pin Swp298 sellers contact you.
