Please click here to check who's online and chat with them.

Circuit Test Probe Pogo Pin P078 For Pcba

Supplier From China
Apr-29-22

In-circuit Test Probe Pogo Pin P078 Series for Printed Circuit Board Assembly

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe P078-BK-346 series here. The diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, BK, H, S, T, E, C, U, G, etc., are available for test probes.


For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 200 gf (7 oz) at load 4.6 mm

Materials
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: SK4, Au on Ni Plated

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Price and Minimum Quantity

Price: $0.1 - $50
MOQ: Not Specified

Recent User Reviews

This user has not received any reviews yet!

Verification Status


 
 
Contact Supplier
Renew

More Items Similiar to: Circuit Test Probe Pogo Pin P078 For Pcba

GOLD Member
VERIFIED
Nov-21-20
Supplier From New Delhi, Delhi, India
GOLD Member
Sep-03-10
Buyer From Mumbai, Maharashtra, India
Apr-27-22
 
PCBA Test Probe Pogo Pin P166 Series Applied to ICT

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Rated Stroke: 5 mm
Spring Force: 500 gf (11 oz)

Materials
Contact Barrel: Brass, Nickel Plated
Spring: Music Wire, Nickel Plated
Plunger: Steel, Nickel Plated

semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Apr-28-22
 
Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe.
For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 112/150/198 gf (4/5.5/7 oz)

Materials
Receptacle: Brass, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
GOLD Member
VERIFIED
Feb-08-22
Supplier From New Delhi, Delhi, India
 
Hard and tough quality
Unbreakable
GOLD Member
May-06-22
Supplier From Guangzhou, Guangdong, Hong Kong
GOLD Member
Apr-09-25
Supplier From Coimbatore, Tamil Nadu, India
GOLD Member
Dec-26-24
Supplier From Hyderabad, Telangana, India
Apr-29-22
 
Electronic Test Probe Pogo Pin PSICT39 Series for PCBA Inspection

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PSICT39 series here. The diameter is 0.61 mm and the total length is 19.5 mm. Various tip styles, for example, B, H, S, T, E, C, U, G, etc., are available for test probes.

For details, please check below parameters.

Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 70 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.5 mm
Spring Force: 70 gf (2.5 oz) at load 2.5 mm

Materials
Receptacle: Brass, Au on Ni Plated
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated

For more information, please check below catalog.

Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Verification Status