In-circuit Test Probe Pogo Pin PE75 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PE75 series here. Its test center is 75 mil. The diameter is 1.91 mm and the total length is 33.1 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 150 gf (5.5 oz)/200 gf (7.2 oz)/227 gf (8 oz)
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Gold Plated Pogo Pin PCBA Probe PE75(PO) Series for In-circuit Test
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PE75(PO) series here. Its test center is 75 mil. The diameter is 1 mm and the total length is 33 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 155 gf (5.5 oz)/203 gf (7.2 oz)/227 gf (8 oz)/300 gf (10 oz)
Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
* Mastic compound application consist of two coats of. Primer ,Primer and followed by Mastic compound in recommended thickness, ranging from min. 12mm to 25mm in one or two layers to achieve desired thickness without any pin hole and crack.
1). Surface preparation and application of Primer: Refer application method of Primer.
2). After doing necessary surface preparation and application of primer coating, area to be installed with Mastic compound should be divided in to equal no. bays. To maintain even thickness required, place wooden or aluminum batten. Mastic compound is then broken in small pieces and put it in heating pan. While heating, keep material moving to avoid burning. It is heated until it comes in a uniform consistency and then applied on the surface and works it with wooden float, to achieve uniform thickness and smooth surface free from any pinholes.
CHEMICAL RESISTANCE PROPERTIES:
* Mastic compound has good resistance to weak, diluted acids, alkalis salts etc. It is not recommended to use against strong acids, oxidizing acid solvents, oil and fats
STORAGE & PACKING:
* Keep Mastic compound away from direct sunlight, heat solvents etc. Under this condition, its shelf life is unlimited. It is supplied in cake form and approx. wt. is 10 kgs.
HEALTH & SAFETY:
* Handle melted Mastic compound compound very carefully . Avoid contact with skin. It is advisable to wear protective wears at the time of use of Mastic compound and all other our products. This information, given in good faith, is based on results gained from experience and tests. However, all recommendations or suggestions are made without guarantee since the conditions of use are beyond our control.
In-circuit Test Probe Pogo Pin P156 Series for PCB Assembly Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQ156 series here. Its test center is 156 mil. The diameter is 2.36 mm and the total length is 33.79 mm. Various tip styles, for example, B, C, G, J, K, L, T, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, WW and WW-L, to fit each test probe
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 3.96 mm (156 mil)
Current Rating: 5 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: 2.75 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.32 mm
Spring Force: 113/198/255/285 gf (4/7/9/10 oz)
Company Information
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
In-circuit Test Probe Pogo Pin P078 Series for Printed Circuit Board Assembly
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P078-BK-346 series here. The diameter is 0.78 mm and the total length is 34.6 mm. Various tip styles, for example, BK, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 200 gf (7 oz) at load 4.6 mm
Materials
Contact Barrel: Phosphor Bronze, Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: SK4, Au on Ni Plated
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
2669 In Circuit Test Probe Pogo Pin Pe75 Suppliers
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In-circuit Test Probe Pogo Pin PQ100 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQ100 series here. Its test center is 100 mil. The diameter is 1.36 mm � and the total length is � 33.25 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are four types of receptacles, namely CR, SC, SW and WW, to fit each test probe.
For details � please check below parameters.
Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: 1.75 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 100/120/156/203/255/284/312 gf (3.5/4/5.5/7.2/9/10/11 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world
Welcome to browse our website � and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.
Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal
In-circuit Test Probe Pogo Pin PICT75 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PICT75Ã? series here. ItsÃ? diameter is 1 mmÃ? and the total length is 21 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, CRWÃ? and SWÃ? to fit each test probe.Ã?Â
For details, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 150 milliohms
Full Stroke: 4 mm
Rated Stroke: 2.65 mm
Spring Force:� 130 gf (4.5 oz) at load 2.65 mm
Materials
Contact Barrel: Phosphor Bronze, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin PE50 for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
In-circuit Test Probe Pogo Pin P085 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P085 series here. Its diameter is 0.82 mm and the total length is 37 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Rated Stroke: 2 mm
Spring Force: 130 gf (5oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Gold-plated Probe Pogo Pin PE100(90) Series for In-circuit Test
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PE100(90) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 34 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: Diameter 1.75 mm
Full Stroke: 6.5 mm
Rated Stroke: 4.3 mm
Spring Force: 284 gf (10 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Spring-loaded Pogo Pin PE100(115) for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PE100(115) series here. Its test center is 100 mil. The diameter is 1.36 mm and the total length is 36.5 mm. Various tip styles, for example, A, B, U, H, K, L, BK, etc., are available for test probes. There are roughly three types of receptacles, namely CR, SC and WW to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 30 milliohms
Mounting Hole Size: Diameter 1.75 mm
Full Stroke: 6.5 mm
Rated Stroke: 4.3 mm
Spring Force: 200 gf (7.2 oz)/255 gf (9 oz)/284 gf (10 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
SILICON WAFERS are the building blocks of modern technology, they provide the substrate onto which circuits are constructed. We offer Prime, Test, Monitor, SEMI standard, and customized silicon wafers in all diameters from 2�¢?�³ to 300mm. Our Wafers meet the SEMI standards, along with customized options.
Silicon On Insulator (SOI) Wafers: Chips fabricated on SOI wafers achieve 30% faster speeds and 80% lower power demands compared to CMOS devices. The SOI structure consists of three layers: a top active device layer for transistor fabrication, a buried oxide (BOX) insulator layer, and a bottom handle wafer layer.
Silicon Float Zone Wafers: is a crystal growth technique that produces highly pure silicon wafers with fewer impurities than traditional methods.
Silicon Thermal Oxide Wafers: Has high quality silicon thermal oxide wafers in all diameters from 2�¢?�³ to 300mm.
Silicon Nitride Wafers: Has different option of film processing for your silicon needs, including LPCVD nitride.
On Insulator (SOI): Has high quality silicon thermal oxide wafers in all diameters from 2�¢?�³ to 300mm.
Fused Silica Wafers: is the amorphous phase of quartz (SiO2).
Borofloat 33 Glass Wafers: is used in a wide range of applications like micro-optics, sensors, microlithography, semiconductor engineering, lighting, medical technology.
FLAT BOTTOM POGOPIN
Flat-Bottom POGOPIN, Multi-Layer Steps Of Outer Diameter Can Be Formed In One Go
Cam Automatic Car Once Formed, Surface Treatment: Can Be Gold Plated. With Anti-Corrosion, Small Size, High Current , Can Be Processed Custom. For Wearable Devices, Notebooks, Medical Electronics Spring Needle Antenna Thimble Charging Probe.
Material: C3604 Size: Customizable
Stretch: 72g�±20g (Customizable) Current: 1-30A Customizable)
Ningbo Yi Yi Precision Technology Co., Ltd. is a professional non-standard high precision hardware parts� manufacturer, our main products includes high precision turned parts/CNC, hexagonal pillar, pogopin linker (pogo pin connector),standard/non-standard fasteners, stainless steel screws, stamping, cold heading bolts/cold heading nuts,stainless steel crank shaft, die casting/casting parts, lock accessories/cylinder.
Switching Probes is a kind of functional probes. They are used to determine the correct location of a terminal in a connector. They can also be used to determine the presence of nonconductive components, etc.
Their application field is mainly as below
Wire harness connector
PCB component detection
Door open-close switch
Fixture component detection
Automation process sensing
Position and retention force
Below switching probe we will introduce is SWP164. Its diameter is 1.64 mm and total length is 44.65 mm.
As usual, switching probes do not entail very high currents, and this model SWP260 can work with the current up to 3 A.
The typical maximum contact resistance of this model SWP164 is 160 m.
The materials used for the construction of switching probes are different for each component:
The barrel is made of brass. Subsequently gold plated during the galvanic plating phase.
The spring is made of gold plated music wire.
The plunger is made of Beryllium Copper, then gold and nickel plated.
The insulating sleeve is made of POM
For details of SWP164 switching probe, please check below parameters.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 160 milliohms, maximum
Full Stroke: 5 mm
Rated Stroke: 3.3 mm
Spring Force: 130 gf (4.5 oz)
Normal Condition: Disconnecting between Plunge 1 and Plunger 2
Press down 1 mm: Continuity between Plunger 1 and Plunger 2
Materials
Contact Barrel: Brass, Au on Ni Plated
Spring: SWP, Au on Ni Plated
Plunger 1: Beryllium Copper, Au on Ni Plated
Plunger 2: Beryllium Copper, Au on Ni Plated
Insulating Sleeve: POM
Advantages of this switching probe
Reliable performance
Low cost of test
Best yield
Our company are also able to change the head shape, total length and diameter, etc., of our switching probes to facilitate their use in different applications. The pitch of installation of switch probes depends on your specific needs.
Company Information
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Test Probe Pogo Pin PL50 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PL50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.68 mm and the total length is 27.53 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, VCR, SC, VSC, CRW and VCRW, to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Mounting Hole Size: Diameter 0.95 mm
Full Stroke: 3.7 mm
Rated Stroke: 2.54 mm
Spring Force: 28/56/85 gf (1/2/3 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Pogo Pin SCPC035 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC035 we will introduce is 0.35 mm in barrel diameter and 7.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2.5 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.5 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.5 mm, the loaded force is about 18 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel Phosphor Bronze, Au on Ni Plated
Bottom Plunger Beryllium Copper, Au on Ni Plated
Top Plunger Beryllium Copper, Au on Ni Plated
Spring SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating 2.5 amps
Contact Resistance 100 milliohms max
Bandwidth 5.8 GHz at -1dB
Inductance 1MHZ at -0.01039 uH
Captance 1MHZ at 2.35287 uF
Specifications:
Full Stroke 1 mm
Rated Stroke 0.5 mm
Spring Force 18 �±5 gf at load 0.5 mm
Mechanical Life about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Test Probe Pogo Pin P166 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P166 series here. Its diameter is 1.66 mm and the total length is 48.4 mm. Various tip styles, for example, B3, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Rated Stroke: 5 mm
Spring Force: 500 gf (11 oz)
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Double-ended Pogo Pin SCPA085 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA085 we will introduce is 0.85 mm in barrel diameter and 5.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This double-ended pogo pin could withstand the current up to 6 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 22 gf or 31 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated
Electronic Specification:
Current Rating: 6 amps
Contact Resistance: 100 milliohms max
Bandwidth: 12.1 GHz at -1dB
Inductance: 1MHZ at -0.03212 uH
Captance: 1MHZ at 0.792734 uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 226 gf at load 0.65 mm, 319 gf at load 0.65 mm
Mechanical Life: about 200000 cycles
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Pogo Pin PC50 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PC50 series here. Its test center is 50 mil, namely 1.27 mm. The diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles, namely CR, SC, SW and CRW, to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: 1 mm
Full Stroke: 6.4 mm
Rated Stroke: 4.3 mm
Spring Force: 100/110/150/200 gf (3.6/4/5.4/7.2 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Printed Circuit Board Assembly Test Probe Pogo Pin PQ75 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQ75 series here. Its test center is 75 mil. The diameter is 1.02 mm and the total length is 33.02 mm. Various tip styles, for example, H, K, L, BK, etc., are available for test probes. There are three types of receptacles, namely CR, SC and WW, to fit each test probe.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms
Mounting Hole Size: Diameter 1.35 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 112/150/198 gf (4/5.5/7 oz)
Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
2669 In Circuit Test Probe Pogo Pin Pe75 Suppliers
Short on time? Let In Circuit Test Probe Pogo Pin Pe75 sellers contact you.
