Double-Sided Spring Pogo Pin Test Probe SCPC031 Applied to Chip Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC031 we will introduce is 0.31 mm in barrel diameter and 6.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms.
The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 150 milliohms max
Bandwidth: 7.5 GHz at -1dB
Inductance: 1MHZ at -0.05856 uH
Captance: 1MHZ at 0.434274 uF
Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.65 mm
Spring Force: 25�±5 gf at load 0.65 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Gramage: 80gsm, 75gsm, 70gsm
Quality: Imported 100% Natural Wood Pulp
Brightness = 102-104%,Natural White
Capability: High Speed Copying100ppm, Laser
Capable,Inkjet Capable, Fax Capable.
Thickness: 103-110 um
Surface roughness TS ml/min: 75-175
Surface roughness BS ml/min: 100-200
Bending stiffness MD: >110 Mn
Bending stiffness CD: >50 Mn
CIE whiteness: 148-152 or 152-165
Cobb Test: 27-33 g/m2 27-33
Two-sided usage gives the paper sheet high opacity.
Smooth paper surface makes sharp printing and copying.
Moist protected wrapper
Size:
International standard
A4: 210 x 297mm
A3: 420x 297mm
8.5 x 11-inch (216 x 279mm)
8.5 x 14-inch (216 x 330mm)
Key Performance:
No jam in photocopy machine
No double feed
Stay flat after copying
Leave no dust in the copy-machine
Nice appearance-white and clean
Nice touch-smooth and bulky
No see through-print both sides
Been developed for : Photocopy Macchines, Laser Printers, Ink-jet Printers, Fax Machines
1. No jam in photocopy machine
2. No double feed
3. Stay flat after copying
4. Leave no dust in the copy-machine
5. Nice appearance-white and clean
6. Nice touch-smooth and bulky
7. No see through-print both sides
8. Used for: Photocopy Machines, Laser Printers, Ink-jet Printers, Fax Machines
Gramage: 80gsm, 75gsm, 70gsm
Quality: Imported 100% Natural Wood Pulp
Brightness = 102-104%,Natural White
Capability: High Speed Copying100ppm, Laser
Capable,Inkjet Capable, Fax Capable.
Thickness: 103-110 um
Surface roughness TS ml/min: 75-175
Surface roughness BS ml/min: 100-200
Bending stiffness MD: >110 Mn
Bending stiffness CD: >50 Mn
CIE whiteness: 148-152 or 152-165
Cobb Test: 27-33 g/m2 27-33
Two-sided usage gives the paper sheet high opacity.
Smooth paper surface makes sharp printing and copying.
Moist protected wrapper
1. No jam in photocopy machine
2. No double feed
3. Stay flat after copying
4. Leave no dust in the copy-machine
5. Nice appearance-white and clean
6. Nice touch-smooth and bulky
7. No see through-print both sides
8. Used for: Photocopy Machines, Laser Printers, Ink-jet Printers, Fax Machines
Gramage: 80gsm, 75gsm, 70gsm
Quality: Imported 100% Natural Wood Pulp
Brightness = 102-104%,Natural White
Capability: High Speed Copying100ppm, Laser
Capable,Inkjet Capable, Fax Capable.
Thickness: 103-110 um
Surface roughness TS ml/min: 75-175
Surface roughness BS ml/min: 100-200
Bending stiffness MD: >110 Mn
Bending stiffness CD: >50 Mn
CIE whiteness: 148-152 or 152-165
Cobb Test: 27-33 g/m2 27-33
Two-sided usage gives the paper sheet high opacity.
Smooth paper surface makes sharp printing and copying.
Moist protected wrapper
Product descriptions from the supplier
We are the largest Manufacturers of A4 Copy Papers in Thailand, Copy Paper, A4 Print Paper, Double A4 Paper, A4 Copy Paper, A4 Papers, A4 Paper Wrapping Machine, Paper A4, A4 Paper Sheeter,
Started as a small paper mill, now we run operations across Thailand right across the world with an annual combined pulp, paper, packaging product and converting capacity of over 19 million tons per annum. Today, We are suppliers of copier paper in world markets, our products are found in more than 120 countries across six continents Europe, North America, South America, Asia, Africa, Australia.
We Manufacture Multipurpose Paper of the following specification.
Gramage: 80gsm, 75gsm, 70gsm
Quality: Imported 100% Natural Wood Pulp
Brightness = 102-104%,Natural White
Capability: High Speed Copying100ppm, Laser
Capable,Inkjet Capable, Fax Capable.
Thickness: 103-110 um
Surface roughness TS ml/min: 75-175
Surface roughness BS ml/min: 100-200
Bending stiffness MD: >110 Mn
Bending stiffness CD: >50 Mn
CIE whiteness: 148-152 or 152-165
Cobb Test: 27-33 g/m2 27-33
Two-sided usage gives the paper sheet high opacity.
Smooth paper surface makes sharp printing and copying.
Moist protected wrapper
Size:
International standard
A4: 210 x 297mm
A3: 420x 297mm
8.5 x 11-inch (216 x 279mm)
8.5 x 14-inch (216 x 330mm)
Key Performance:
No jam in photocopy machine
No double feed
Stay flat after copying
Leave no dust in the copy-machine
Nice appearance-white and clean
Nice touch-smooth and bulky
No see through-print both sides
Been developed for: Photocopy Machines, Laser Printers, Ink-jet Printers, Fax Machines
Features and Benefits:
Perfect for high-quality printing and copying
Super high whiteness produces outstanding clarity and contrast for all graphics and text
Precision-cut edges for trouble-free performance
User-friendly box design with built-in handle for easy carrying, tear slot perforation for easy access to the reams and label for filing
Outstanding Packaging
Standout/premium.
Special protective/moisture - proof wrapper.
Economic box
PACKING DETAILS
500 SHEETS PER REAM.
5 REAMS PER BOX.
1560 BOXES PER 20FT CONTAINER (WITH PALLET).
1600 BOXES PER 20FT CONTAINER (WITHOUT PALLET).
7800 REAMS TOTAL IN ONE 20FCL (WITH PALLET).
8000 REAMS TOTAL IN ONE 20FCL (WITHOUT PALLET).
FOR MORE INFO ON OUR PRODUCT, CONTACT US WITH YOUR FULL AND COMPLETE CONTACT INFO SO WE CAN SEND YOU ALL DETAILS FOR A BETTER COMMUNICATION AND BUILDING A LONG TERM BUSINESS RELATIONSHIP.
909 Double Sided Spring Pogo Pin Test Probe Scpc031 Suppliers
Short on time? Let Double Sided Spring Pogo Pin Test Probe Scpc031 sellers contact you.
KEY PERFORMANCE:
No jam in photocopy machine
No double feed
Stay flat after copying
Leave no dust in the copy-machine
Nice appearance-white and clean
Nice touch-smooth and bulky
No see through-print both sides
Been developed for : Photocopy Mac
KEY PERFORMANCE:
No jam in photocopy machine
No double feed
Stay flat after copying
Leave no dust in the copy-machine
Nice appearance-white and clean
Nice touch-smooth and bulky
No see through-print both sides
Been developed for : Photocopy Mac
Double-sided Spring Pogo Pin Test Probe SCPC058 for IC Test
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC058 we will introduce is 0.58 mm in barrel diameter and 8.85 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This double-sided spring pogo pin could withstand the current up to 4 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1.2 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 35 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated
Electronic Specification:
Current Rating: 4 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.02158 uH
Captance: 1MHZ at 1.4027 uF
Specifications:
Full Stroke: 1.2 mm
Rated Stroke: 0.8 mm
Spring Force: 35�±7 gf at load 0.8 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-sided Spring Pogo Pin Test Probe SCPA030 Series Applied to IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This probe pin could withstand the current up to 1.5 Amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 0.85 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.85 mm, the loaded force is about 10 gf or 20 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SUS304, Au on Ni Plated
Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.02829 uH
Captance: 1MHZ at -0.609436 uF
Specifications:
Full Stroke: 2 mm
Rated Stroke: 0.85 mm
Spring Force: 10�± 3 gf at load 0.85 mm, 20�± 6 gf at load 0.85 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-sided Spring Pogo Pin Test Probe SCPA021 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA021 we will introduce is 0.21 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated
Electronic Specification:
Current Rating: 1 amp
Contact Resistance: 200 milliohms max
Bandwidth: 9.7 GHz at -1dB
Inductance: 1MHZ at -0.05647 uH
Captance: 1MHZ at 0.864722 uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 124 gf at load 0.65 mm
Mechanical Life: about 100000 cycles
semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
SPECIFICATIONS FOR DOUBLE A4 PAPERS
80GMS COPY PAPERS
Double A Copy Paper
Scrooge Copy paper
Ik Plus Copy Paper
Ik Yellow Copy Paper
Navigator copy paper
Laser / Copier Paper
Reflex Copy Paper
Xerox Copy Paper
Chamex Multi
Chamex Office
Mondi Rotatrim
Golden Star
SPECIFICATION FOR A4 COPY PAPER :
A4 COPY PAPER 80 GSM /75 GSM / 70 GSM
Weight: 80 GSM
Sheet Size: 210mm X 297mm,
Whiteness : 95-105
International Size A4
Quality: Imported 100% Virgin Wood Pulp
Whiteness = High Speed Copying 100ppm Laser Capable, Inkjet Capable, Fax Capable.
Thickness :103-110 um
Surface roughness TS ml/min:75-175
Surface roughness BS ml/min:100-200
Bending stiffness MD > 110 Mn
Bending stiffness CD > 50 Mn
CIE WHITENESS : 148-152
Cobb Test : 27-33 g/m2 27-33
KEY PERFORMANCE:
- No jam in photocopy machine
- No double feed
- Stay flat after copying
- Leave no dust in the copy-machine
- Nice appearance-white and clean
- Nice touch-smooth and bulky
- No see through-print both sides
- Been developed for:- Photocopy Machines, Fax High Speed Copying 100ppm, Laser printers, Inkjet printers, Fax Machines.
ADVANTAGES OF OUR PAPER QUALITY :
- Smooth paper surface makes sharp printing and copying.
- Two-sided usage gives the paper sheet high opacity.
- Bright Appearance gives high print contrast to the printing.
- Sharp cutting edges prolongs performance of copying machine.
- Anti-curl quality reduces paper jams in the copier.
- Low dust content minimizes copier running cost.
- 500 sheets guarantee in Each Pack.
PACKING LIST:
5 Reams per box.
500 Sheet per Ream.
7800 Reams (1560 Cartons)-1*20FT Container with pallet .
8000 Reams (1600 Cartons) - 1*20FT Container without pallet.
INSPECTION . Quality and Quantity Inspections shall be carried out by SGS at seller's expense; at the port of loading.
MINIMUM ORDER: 20 Tons /1*20ft Container (7800/Reams with pallets or 8000 / Reams without pallet).
Key Specifications/ Special Features:
We are Copy Paper suppliers with specifications-Size: A4 (210mm x 297mm)- Substance: 80gsm- Brightness: 102-104% above- Color: white- Whiteness: CIE167- Grade: All purpose Premium Paper- Sheet in Ream: 500- Roughness: 140ml/Min- Roughness: 140ml/Min- Thickness: 110um- Opacity: 95%- Ream box: 5 Ream- Quality: Very High Key Performance- No jam in Photocopy machines- No double feed- Stay flat after copying (even in laser)- Leave no dust in the copy machine- White and clean, Smooth and bulky- No see through pring in both side- Best result in Photocopy machines, Laser printers, Inkjet printer
We manufacture multipurpose paper of the following specification.
Gramage: 80gsm, 75gsm, 70gsm
Quality: 100% imported natural wood pulp
Brightness = 102-104%, natural white
Capacity: high speed copying100ppm,
Capable laser , inkjet capable, fax capable.
Thickness: 103-110 um
Surface roughness ts ml / min: 75-175
Surface roughness bs ml / min: 100-200
Bending stiffness md:> 110 mn
Bending stiffness cd:> 50 mn White
whiteness: 148- 152 or 152-165
Cobb test: 27-33g / m2 27-33
Use on two sides gives the paper sheet high opacity.
Smooth paper surface makes printing and copying.
Wet protected packaging
Size:
International standard
A4: 210x297mm
A3: 420x 297mm
8.5x11 inches (216x279mm)
8.5x14 inches (216x330mm)
Main performance:
Congestion-free photocopy machine
No double feed
Stay flat after copying
Don't leave dust on the copy machine
Pleasant-white and clean appearance
Pleasant-smooth, bulky touch
Without seeing both sides
Developed for: photocopy macchines, laser printers , inkjet printers, fax machines
Features and Benefits:
Perfect for high-quality printing and copying
Super-high whiteness produces excellent clarity and contrast for all graphics and text
Precision cut edges for trouble-free performance User
-friendly housing design with built-in handle for easy transport, punching slot for easy access to reams and label for filing
Excellent
Featured / Premium packaging .
Special protective / moisture-proof packaging.
Economical box
Packaging details
500 sheets per ream.
5 reams per box.
1560 cartons per 20-foot container (with pallet).
1600 boxes per 20-foot container (without pallet).
7800 reams total in a 20fcl (with pallet).
8000 reams total in a 20fcl (without pallet).
Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductive Reactance: 1MHZ at -0.05996 uH
Capacitive Reactance: 1MHZ at 0.425647 uF
Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20 6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Spring Pogo Pin Semiconductor Test Probe SCPC028 Applied to IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC028 we will introduce is 0.28 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 amps. The typical maximal contact resistance is about 150 milliohms.
The plunger can be pressed at a distance of up to 1.05 mm. But it is better to be pressed at a distance of 0.7 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.7 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze/Gold Clad Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 150 milliohms max
Bandwidth: 8.5 GHz at -1dB
Inductive Reactance: 1MHZ at -0.0788 uH
Capacitive Reactance: 1MHZ at 0.3165 uF
Specifications:
Full Stroke: 1.05 mm
Rated Stroke: 0.7 mm
Spring Force: 25�±7 gf at load 0.7 mm
Mechanical Life: about 100000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Spring Loaded Pogo Pin Test Probe BIP68 Series for Battery Contact
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP68 series of battery contact probes. The outside diameter is usually 0.68 mm and there are some common tip styles, for example J.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 0.95 mm (37 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 0.5 mm
Rated Stroke: 0.4 mm
Spring Force: 10 gf (0.35 oz)
Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Spring-Loaded Pogo Pin SCPA031(21) for Chip Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA031(21) we will introduce is 0.31 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 0.7 mm. But it is better to be pressed at a distance of 0.45 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.45 mm, the loaded force is about 20 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.4 GHz at -1dB
Inductance: 1MHZ at -0.05996 uH
Captance: 1MHZ at 0.425647 uF
Specifications:
Full Stroke: 0.7 mm
Rated Stroke: 0.45 mm
Spring Force: 20�?�±6 gf at load 0.45 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Double-sided Spring Pogo Pin SCPA057 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
SCPA057 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
Its parameters are as below.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 3 Amps
Contact Resistance: 100 milliohms, max
Bandwidth: 5 GHz at -1dB
Propagation Delay: 24 ps
Inductance: 1MHZ at -0.03664 uH
Captance: 1MHZ at -0.704638 uF
Specifications:
Full Stroke: 0.63 mm
Rated Stroke: 0.5 mm
Spring Force: 45 ±13 gf at load 0.5 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Double-ended Pogo Pin SCPE025 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPE025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 0.5 Amp. The typical maximal contact resistance is about 250 milliohms.
The plunger can be pressed at a distance of up to 1.9 mm. But it is better to be pressed at a distance of 1.25 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1.25 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze/ Gold Clad Phosphor Bronze, Au on Ni Plated
X: Bottom (Plunger 1): SK4, Au on Ni Plated
Y: Top (Plunger 2): SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 0.5 amp
Contact Resistance: 250 milliohms max
Bandwidth: 10.8 GHz at -1dB
Inductive Reactance: 1MHZ at -0.07234 uH
Capacitive Reactance: 1MHZ at 0.329458 uF
Specifications:
Full Stroke: 1.9 mm
Rated Stroke: 1.25 mm
Spring Force: 12 �±4 gf at load 1.25 mm
Mechanical Life: about 100000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Double-ended Pogo Pin Test Probe SCPA100 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA100 Â we will introduce is 1 Â mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Â Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
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