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Double-Sided Spring Pogo Pin Test Probe Scpa030

Supplier From China
May-19-22

Double-sided Spring Pogo Pin Test Probe SCPA030 Series Applied to IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from stainless steel plated with gold and nickel. This probe pin could withstand the current up to 1.5 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 2 mm. But it is better to be pressed at a distance of 0.85 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.85 mm, the loaded force is about 10 gf or 20 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SUS304, Au on Ni Plated

Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.02829 uH
Captance: 1MHZ at -0.609436 uF

Specifications:
Full Stroke: 2 mm
Rated Stroke: 0.85 mm
Spring Force: 10�± 3 gf at load 0.85 mm, 20�± 6 gf at load 0.85 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Price and Minimum Quantity

Price: $0.1 - $50
MOQ: Not Specified

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Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

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The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 25 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 150 milliohms max
Bandwidth: 7.5 GHz at -1dB
Inductance: 1MHZ at -0.05856 uH
Captance: 1MHZ at 0.434274 uF

Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.65 mm
Spring Force: 25�±5 gf at load 0.65 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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The plunger can be pressed at a distance of up to 1.2 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 35 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.

Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: Beryllium Copper, Au on Ni Plated
Spring: SUS304, Au on Ni Plated

Electronic Specification:
Current Rating: 4 amps
Contact Resistance: 100 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.02158 uH
Captance: 1MHZ at 1.4027 uF

Specifications:
Full Stroke: 1.2 mm
Rated Stroke: 0.8 mm
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Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 10 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.1 GHz at -1dB
Inductance: 1MHZ at -0.02524 uH
Captance: 1MHZ at 1.12735 uF

Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 10 ±3 gf at load 0.65 mm
Mechanical Life: about 200000 cycles

Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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