Interface Pin Test Probe IFP-005 for Transmitting Electrical Signals
Interface probes are functional probes. They are not used for tests and only play a role in connection or control in switching functions, etc. Interface probes are used for transmitting electrical signals from one end to the other end in test fixtures.
Interface probes manufactured by Centalic mainly include the models 001, 002, 003, 004, 005, 006 and 007 in IFP series. This product, IFP-005, is made from phosphor bronze or brass, plated with gold. Characterized by excellent conductivity, it is usually used for the connection of electronic components and functional tests.
IFP-005 interface probe is 17.8 mm in total length. If customers wish to change its length or diameter, we could do as required. Unlike IFP-001, it has a base at the end. If the gold plating is expected to be thicken or thinned, we could try to do according to requirements. Customization is welcome.
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
Welcome to browse our website and download any catalogs of our products.
Notice:
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Semiconductor Test Probe Pogo Pin SCFE035 for Integrated Circuit Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCFE035 we will introduce is 0.35 mm in barrel diameter and 18 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold The bottom plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 150 milliohms.
The plunger can be pressed at a distance of up to 1.5 mm. But it is better to be pressed at a distance of 1 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1 mm, the loaded force is about 38 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 150 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.05517 uH
Captance: 1MHZ at 0.462432 uF
Specifications:
Full Stroke: 1.5 mm
Rated Stroke: 1 mm
Spring Force: 38�?�±11 gf at load 1 mm
Mechanical Life: about 200000 cycles
For more information, please check below catalog.
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CHZ199 Series for Electronic Test
Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CHZ199 harness probe we will introduce here is 1.99 mm in diameter and 33.2 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.4 mm at most when this probe works, although the plunger can move as far as 6.6 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.4 mm, its loaded force is about 133 gf, namely 4.7 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.6 mm
Rated Stroke: 4.4 mm
Spring Force: 133�?�±40 gf (4.7 oz) at load 4.4 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
For more information, please check below catalog.
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CH136-J for the Tests of Automotive Industry
Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CH136 harness probe we will introduce here is 1.36 mm in diameter and 33 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 5.3 mm at most when this probe works, although the plunger can move as far as 8 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 5.3 mm, its loaded force is about 57 gf, namely 2 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 8 mm
Rated Stroke: 5.3 mm
Spring Force: 57±17 gf (2 oz) at load 5.3 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980.Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Semiconductor Test Probe Pogo Pin SCPA030 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 10 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.1 GHz at -1dB
Inductance: 1MHZ at -0.02524 uH
Captance: 1MHZ at 1.12735 uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 10 ±3 gf at load 0.65 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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Spring Pogo Pin Battery Contact Test Probe BIP94 for Connector Application
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP94 series of battery contact probes. The outside diameter is usually 0.94 mm and there are some common tip styles, for example J.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 0.78 mm
Rated Stroke: 0.7 mm
Spring Force: 30 gf (1.05 oz)
Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Battery Contact Probe Test Pogo Pin BIP148 Series for Connector Application
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP148 series of battery contact probes. The outside diameter is usually 1.49 mm and there are some common tip styles, for example J.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 2.16 mm (85 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 2 mm
Rated Stroke: 1.33 mm
Spring Force: 25 gf (1/ 0.9 oz)
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin P085 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P085 series here. Its diameter is 0.82 mm and the total length is 37 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Rated Stroke: 2 mm
Spring Force: 130 gf (5oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CH200-H(14) for the Tests of Automotive Industry
Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CH200 harness probe we will introduce here is 1.99 mm in diameter and 39 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.5 mm at most when this probe works, although the plunger can move as far as 7.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.5 mm, its loaded force is about 312 gf, namely 11 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7.3 mm
Rated Stroke: 4.5 mm
Spring Force: 312�?�±65 gf (11 oz) at load 4.5 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW.
The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: Diameter 1 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Test Probe BIP114 Series for Battery Contact
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP114 series of battery contact probes. The outside diameter is usually 1.14 mm and there are some common tip styles, for example round head or pointed head.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 1.14 mm
Rated Stroke: 1.14 mm
Spring Force: 110 gf (4 oz)
Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Spring-loaded Pogo Pin CHZ136-J Series Applied to Electronic Test
Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CHZ136-J harness probe we will introduce here is 1.36 mm in diameter and 32.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.9 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 130 gf, namely 4.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 130�?�±40 gf (4.5 oz) at load 4.6 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 14 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel�¯�¼? Ph/SP, Au on Ni Plated
Bottom Plunger�¯�¼? BeCu, Au on Ni Plated
Top Plunger BeCu, Au on Ni Plated
Spring SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating 1 amp
Contact Resistance 100 milliohms max
Bandwidth ? 9.3 GHz at -1dB
Inductance 1MHZ at -0.02384 uH
Captance 1MHZ at 1.06747 uF
Specifications:
Full Stroke 1.1 mm
Rated Stroke 0.65 mm
Spring Force 4 gf at load 0.65 mm
Mechanical Life about 100000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Double-ended Pogo Pin SCPC030(50)-XX-67 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC030(50)-XX-67 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.5 GHz at -1dB
Inductance: 1MHZ at -0.05032 uH
Captance: 1MHZ at 0.502464 uF
Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.8 mm
Spring Force: 12�?�±3 gf at load 0.8 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Test Probe Pogo Pin SCPA020 for Integrated Circuit Inspection
Semiconductor test probes are usually called double-ended pogo pins. Â Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA020 we will introduce is 0.2 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. � Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottome plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.6 mm at most in working environments. Otherwise the spring will probably be damaged severely under constanct pressure. When the plunger is pressed at a distance of 0.6 mm, the loaded force is about 12 gf, which fluctuates to a tolerane.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP Â Au on Ni Plated
Electronic Specification:
Current Rating: 1 amp
Contact Resistance: 200 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.13527uH
Captance: 1MHZÂ at 0.186437uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.6 mm
Spring Force: 12 ±4 gf at load 0.6 mm
Mechanical Life: about 100000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Welcome to browse our website centalic.com and download any catalogs of our products.
Electronic Test Probe Double-sided Spring Pogo Pin SCPA057 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
SCPA057 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
Its parameters are as below.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 3 Amps
Contact Resistance: 100 milliohms, max
Bandwidth: 5 GHz at -1dB
Propagation Delay: 24 ps
Inductance: 1MHZ at -0.03664 uH
Captance: 1MHZ at -0.704638 uF
Specifications:
Full Stroke: 0.63 mm
Rated Stroke: 0.5 mm
Spring Force: 45 ±13 gf at load 0.5 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Portable Ultrasound Machine
Manufacturer year : 2017
Used condition like new, Excellent and ready to work
Come with warranty 12 month
Features:
The provides advanced imaging quality and a high level of functionality that provides efficiency to support the most accurate diagnostic activities. The system s monitor includes a full touch panel for intuitive operation right at your fingertips, while the basic operations, such as image size or gain adjustment, can be made with one hand using touch screen gestures.
Include:
Main unit
Linear probe L64 (frequency 5MHz-18MHz)
Black and white printer
Manual book
Power cable
Specification:
Monitor: 11.6 inch full touch panel (FullHD)
Size: 29.6 cm (W) x 26.0 cm (D) x 7.5-26 cm (H)
Weight: Approximately 4.5 kg
Image signal external output: HDMI
Frequency probe: Maximum 18 MHz
Sale GE Versana Active Ultrasound Machine
Manufacturer year : 2020
Used condition like new, Excellent and ready to work
Come with warranty 12 month
Features:
The Versana Active v1.5 Primary Care Ultrasound System provides accurate and high-precision ultrasound imaging data of a patient. Versana Active is an AI-enabled primary care ultrasound system with precise tools designed to enable rapid patient assessments and confident decisions. This systemâ??s robust design makes it suitable for patient monitoring in the hospital and an office setting.
Adaptable and Easy-to-use: This primary care ultrasound system offers excellent ease to health care providers with its utilitarian design and configurability. An expansive 15.6 LCD screen has an intuitive interface and gives a clear and bright display of the ultrasound image and other vital data. A keyboard with a set of pre-programmed quick-access buttons provides easier and greater control to the user. Changing settings and choosing what you want to see only requires a few strokes of your fingers.
In addition to an excellent display and controls, this system has several attachment points for a gel cup and probe holders. Handles on the front and back and a set of large-high-quality wheels make it highly maneuverable. All the cables and leads are appropriately managed to avoid clutter and entanglement. The cart s height can also be adjusted to suit the scan requirements.
Facilitates Simple Workflow: Proprietary algorithms synthesize patient data and enable fast assessments and confident decisions. A shared underlying platform provides a common user experience and simplifies training protocols. The software includes several display modes and diagrams to facilitate easy and quick assessment.
Versana Active can assist with a number of medical procedures and conditions, including sonobiometry, thyroid assessment, tissue doppler imaging, B-flow representation, tissue velocity imaging, etc. For greater assistance of the medical staff, there are many viewing options of the acquired images to make the analysis easier. All the data can be easily stored and tracked to help medical personnel follow the patients response to therapy.
Precision Assessment Applications: The wide variety of high-quality precision probes that adapt to this system are useful for several applications. These probes provide a crisp and clear image of the target area, facilitating critical procedures like perioperative care, tendon, muscle and joint assessment, pediatric assessment, and neonatal care.
Package Include:
- Versana Active Ultrasound System
- Probe L6-12-RS
- Cart
- AC Adapter
