Pcb Assembly Test Probe Pogo Pin Pql50 Series

PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT

In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW.

The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: Diameter 1 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz)

Materials
Receptacle: Phosphor Bronze, Gold Plated
Contact Barrel: Phosphor Bronze, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: Beryllium Copper, Nickel Plated or Gold Plated

Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.