Yongin-si,
Gyeonggi-do,
South Korea (Republic Of Korea)
Applications :
Measurement of J (current density), V (voltage), L (luminance) characteristics of display devices such as OLED/LED/QLED
Features:
Various component interworking support is available
Improve measurement speed through optimization.
Provides an intuitive user-friendly UI.
Key functions:
Measurement of JVL Characteristics
Pre-Test function (lighting test and manual measurement, etc.)
Measurement data list
Graph type editing function
Automatic merging of measurement data and report file creation functions
Data storage format, display unit, and number of significant digits setting functions
Please ask detailed and specific
questions about Pricing, Minimum Order Quantity, Delivery Timelines etc. Detailed Messages
result in prompt responses.
