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Pogo Pin Test Probe Bip47 For Battery Contact

Supplier From China
Apr-09-22

Pogo Pin Test Probe BIP47 Series for Battery Contact

Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.

Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

The products in this page are classified into BIP47 series of battery contact probes. The outside diameter is usually 1.6 mm and there are some common tip styles, for example J.

For details, please check below parameters.

Technical Specifications
Recommended
Minimum Center: 2.54 mm (100 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 20 milliohms (Maximum)
Full Stroke: 1.5 mm
Rated Stroke: 1.5 mm
Spring Force: 80 gf (2.8 oz)

Materials
Contact Barrel: Brass, Gold Plated
Spring: Music Wire, Gold Plated
Plunger: BeCu, Gold Plated

Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

Price and Minimum Quantity

Price: $0.1 - $50
MOQ: Not Specified

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� 
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A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. � The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

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For details, please check below parameters.

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Company information:
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Technical Specifications
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Company information:
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Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

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Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.

A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.

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For details, please check below parameters.

Technical Specifications
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Materials
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Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.

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