Burn-in Test Socket
Burn in test socket is a critical component used in semiconductor testing to assess the reliability and durability of integrated circuits (ICs) over extended periods. The burn in socket facilitates the application of stress tests, including elevated temperatures and voltage levels, to identify potential failures and ensure the quality of ICs before deployment. Get in touch with us to request a quote and discover the precision of our PCR burn socket series.

Burn-in Test Socket Details
Burn-in Rubber Socket
Excellent electrical performance
No ball damage
Easy to maintain and replace
Temperature -40~125â??

Features of Burn-in Test Socket
Robust Construction: Test and burn in sockets are designed for durability and reliability during prolonged testing periods.

High Temperature Tolerance: The burn in test socket is capable of withstanding elevated temperatures necessary for burn-in testing.

Secure Connection: The burn in socket provides a stable interface between the IC and testing equipment, ensuring accurate results.

Easy Handling: The burn in test socket features a user-friendly design for efficient insertion and removal of ICs during testing processes.

Compatibility: The burn in semiconductor socket supports various IC packages and sizes, offering versatility for different testing requirements.