Semiconductor Test Probe Pogo Pin SCPA030 Series for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA030 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 Amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 10 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.1 GHz at -1dB
Inductance: 1MHZ at -0.02524 uH
Captance: 1MHZ at 1.12735 uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.65 mm
Spring Force: 10 ±3 gf at load 0.65 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Spring Pogo Pin Battery Contact Test Probe BIP94 for Connector Application
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP94 series of battery contact probes. The outside diameter is usually 0.94 mm and there are some common tip styles, for example J.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 0.78 mm
Rated Stroke: 0.7 mm
Spring Force: 30 gf (1.05 oz)
Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Battery Contact Probe Test Pogo Pin BIP148 Series for Connector Application
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP148 series of battery contact probes. The outside diameter is usually 1.49 mm and there are some common tip styles, for example J.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 2.16 mm (85 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms (Maximum)
Full Stroke: 2 mm
Rated Stroke: 1.33 mm
Spring Force: 25 gf (1/ 0.9 oz)
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
In-circuit Test Probe Pogo Pin P085 Series for PCBA Inspection
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe P085 series here. Its diameter is 0.82 mm and the total length is 37 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes.
For details, please check below parameters.
Technical Specifications
Recommended
Rated Stroke: 2 mm
Spring Force: 130 gf (5oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Cable Harness Probe Pogo Pin CH200-H(14) for the Tests of Automotive Industry
Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CH200 harness probe we will introduce here is 1.99 mm in diameter and 39 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.5 mm at most when this probe works, although the plunger can move as far as 7.3 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.5 mm, its loaded force is about 312 gf, namely 11 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 7.3 mm
Rated Stroke: 4.5 mm
Spring Force: 312�?�±65 gf (11 oz) at load 4.5 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
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PCBA Assembly Test Probe Pogo Pin PQL50 Series Applied to ICT
In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.
We will introduce in-circuit test probe PQL50 series here. Its diameter is 0.78 mm and the total length is 43.2 mm. Various tip styles, for example, H, S, T, E, C, U, G, etc., are available for test probes. There are roughly four types of receptacles to fit the probes, for instance, CR, SW, CRW and WW.
The plunger can be pressed at a distance of up to 6.35 mm. But it is better to be pressed at a distance of 4.3 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 4.3 mm, the loaded force is about 5.5 oz, 7 oz or 8 oz, which fluctuates to a tolerance.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.27 mm (50 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 60 milliohms
Mounting Hole Size: Diameter 1 mm
Full Stroke: 6.35 mm
Rated Stroke: 4.3 mm
Spring Force: 150 gf (5.5 oz)/ 185 gf (7 oz)/ (227 gf (8 oz)
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Test Probe BIP114 Series for Battery Contact
Battery contact probes are characterized by excellent conductivity, low resistance and high stability. They are mainly used for contact, connection and conduction, for example they can be used for connecting batteries or other electrical components.
Battery contact probes are made from high-end materials. The specifications, outside diameters and tip styles vary considerably from probe to probe. Many common models are always kept in stock so as to meet the needs of various industries for bulk orders.
A battery contact probe is often comprised of a barrel, a plunger and a spring. The barrel is usually manufactured from brass and phosphor bronze is an alternative for customization. The spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold in order to strengthen the conductivity.
The products in this page are classified into BIP114 series of battery contact probes. The outside diameter is usually 1.14 mm and there are some common tip styles, for example round head or pointed head.
For details, please check below parameters.
Technical Specifications
Recommended
Minimum Center: 1.91 mm (75 mil)
Current Rating: 3 Amps, continuous
Contact Resistance: 40 milliohms (Maximum)
Full Stroke: 1.14 mm
Rated Stroke: 1.14 mm
Spring Force: 110 gf (4 oz)
Company information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Wire Harness Probe Spring-loaded Pogo Pin CHZ136-J Series Applied to Electronic Test
Harness probes are mainly used directly or for the tests of automotive industry. Parts of them are also applied to communication electronics, medical equipment, equipment automation, etc. The standard and requirements for them are high compared with other test probes. Harness probes can be divided into screw-thread harness probes, harness switch probes, non-screw-thread harness probes, position-limited harness probes and high-current harness probes, etc.
The CHZ136-J harness probe we will introduce here is 1.36 mm in diameter and 32.8 mm in total length. Its barrel is made of brass plated with gold and nickel. The plunger is made of gold-plated beryllium copper, which is softer but less magnetic than the alternative SK4. The spring inside is made of music wire plated with gold and nickel.
This probe can withstand up to the current 3 Amps. Its typical maximum contact resistance is 50 milliohms. It is suggested the plunger be pressed at a distance of 4.6 mm at most when this probe works, although the plunger can move as far as 6.9 mm. Otherwise, the spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.6 mm, its loaded force is about 130 gf, namely 4.5 ounces or so. Furthermore, the force fluctuates in a range due to the tolerance.
Technical Specifications
Recommended
Current Rating: 3 Amps, continuous
Contact Resistance: 50 milliohms
Full Stroke: 6.9 mm
Rated Stroke: 4.6 mm
Spring Force: 130�?�±40 gf (4.5 oz) at load 4.6 mm
Materials (plated)
Barrel: Brass, Au on Ni Plated
Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Company Information
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA025 we will introduce is 0.25 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The same is with the top plunger. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.65 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.65 mm, the loaded force is about 14 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel�¯�¼? Ph/SP, Au on Ni Plated
Bottom Plunger�¯�¼? BeCu, Au on Ni Plated
Top Plunger BeCu, Au on Ni Plated
Spring SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating 1 amp
Contact Resistance 100 milliohms max
Bandwidth ? 9.3 GHz at -1dB
Inductance 1MHZ at -0.02384 uH
Captance 1MHZ at 1.06747 uF
Specifications:
Full Stroke 1.1 mm
Rated Stroke 0.65 mm
Spring Force 4 gf at load 0.65 mm
Mechanical Life about 100000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Electronic Test Probe Double-ended Pogo Pin SCPC030(50)-XX-67 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPC030(50)-XX-67 we will introduce is 0.3 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold. The bottom plunger is made from beryllium copper plated with nickel and gold. The top plunger is made from SK4 plated with nickel and gold. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 1.5 amps. The typical maximal contact resistance is about 100 milliohms.
The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 1.5 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.5 GHz at -1dB
Inductance: 1MHZ at -0.05032 uH
Captance: 1MHZ at 0.502464 uF
Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.8 mm
Spring Force: 12�?�±3 gf at load 0.8 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Test Probe Pogo Pin SCPA020 for Integrated Circuit Inspection
Semiconductor test probes are usually called double-ended pogo pins. Â Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
This product SCPA020 we will introduce is 0.2 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. � Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottome plunger is made from SK4 plated with nickel and gold. The same is with the top plunger. The inner spring is made from SUS304 plated with gold and nickel. This probe pin could withstand the current up to 1 Amp. The typical maximal contact resistance is about 200 milliohms
The plunger can be pressed at a distance of up to 1.1 mm. But it is better to be pressed at a distance of 0.6 mm at most in working environments. Otherwise the spring will probably be damaged severely under constanct pressure. When the plunger is pressed at a distance of 0.6 mm, the loaded force is about 12 gf, which fluctuates to a tolerane.
For details, please check parameters in below table.
Materials (plated)
Barrel: Ph/ SP, Au on Ni Plated
Bottom Plunger: SK4, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP Â Au on Ni Plated
Electronic Specification:
Current Rating: 1 amp
Contact Resistance: 200 milliohms max
Bandwidth: 9.3 GHz at -1dB
Inductance: 1MHZ at -0.13527uH
Captance: 1MHZÂ at 0.186437uF
Specifications:
Full Stroke: 1.1 mm
Rated Stroke: 0.6 mm
Spring Force: 12 ±4 gf at load 0.6 mm
Mechanical Life: about 100000 cycles
Company Information:
Centalic Technology Development Ltd was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
Welcome to browse our website centalic.com and download any catalogs of our products.
Electronic Test Probe Double-sided Spring Pogo Pin SCPA057 for IC Inspection
Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.
SCPA057 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.
Its parameters are as below.
Materials (plated)
Barrel: Ph, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: BeCu, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated
Electronic Specification:
Current Rating: 3 Amps
Contact Resistance: 100 milliohms, max
Bandwidth: 5 GHz at -1dB
Propagation Delay: 24 ps
Inductance: 1MHZ at -0.03664 uH
Captance: 1MHZ at -0.704638 uF
Specifications:
Full Stroke: 0.63 mm
Rated Stroke: 0.5 mm
Spring Force: 45 ±13 gf at load 0.5 mm
Mechanical Life: about 200000 cycles
Company Information:
Centalic Technology Development Ltd. was founded in 1980. Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on.
8 Inch Veterinary Ultrasound Scanner BXL-V50 For Sheep/Pig/Cow/Horse/Bovine/Equine
Description:
Our BXL-V50 is equipped with� Multi-probe optional, which is suitable for large animals including horses, cows and sheeps. It is widely used in in pasture, animal hospitals, veterinary stations and clinical teaching. It can be used to detect early pregnancy, follicle monitoring, fetal vitality, uterine disease, etc.
Main Functions:
- For pregnant animals
- Master postpartum uterus recovery
- Diagnosis of uterine diseases
- Observing embryo development
- Measuring fetal heart rate
- Estimate the number of babies
Features:
- Language: English
- Waterproof device
- 8 Inch full digital LCD display screen
-� 16G memory to store countless videos and pictures
-� ulti-probe optional
- Longer Working Time: â?¥6.5 hours
- Super long standby time
Specifications:
- Model: BXL-V50
-� Optional Probe Configuration:(no appendages)
(1) 6.5MHz Linear rectal probe for large animal
(2) 3.5MHz Convex probe
(3) 6.5MHz Linear rectal probe for sheep
-Imaging Modes: B, M, 2B, B/M, 4B
-Scan Frame Rate: 60 frams/second
-Didital Channels: 16 Channels
-Dust And Splash Proof: IP56-Host/IP67-Probe
-Grayscale: 256
-Storage Capacity: 16GB
-Image Storage: 1000*frams
-Storage Expand Function: Support
-Storage Export Function: Support U disk/TF card(with Reader)
-Display: 8.0-inch HD LCD Screen(600*800 Pixel)
-Cine Loop:Support(â?¥256 Frames)
-Pseudo Color: 8 Kinds Support
-Body Remark: 45 Kinds Support
-Battery Life: 6-6.5 Hours( single battery)
-Charging Options: DC Power Adapter
-Weight(Host): 1.2 KGS
-Weight(Packaged):5.75 KGS
-Host size: about 206 x 120 x 35 (mm, length x width x height);
-Packaging: high Strength Anti-damage Protection Box
-Left and right buttons (convenient for left and right hand operation)
-Measurement Function: Measurement of back fat, eye muscle, automatic back fat thickness measurement, lean meat rateÃ?Â
-Host rated input: DC14V 3.0A;
-Adapter output: DC14.0V 3.0A;
-Network power supply: 100-240V~1.2-0.6A Frequency: 50-60Hz;
Custom Duties & Taxes
1. Import duties, taxes, and charges are not included in the item price or postage cost. These charges are the buyer's responsibility.
2. Avoiding some unnecessary trouble, please check with your country's customs office to inform us what we should declare its value before shipping.
Apache ultrasound system is a handheld ultrasound built-in 64 physical channels and patented micro-beamforming technology to provide high-quality medical imaging. Extremely low power consumption enables a long scanning time. Easy to carry and connected with mobile devices, medical imaging becomes reachable at your fingertip.
Models: S 30 / S 30 H - S 60 / S 60 H - S 100 / s 100 H - S 180 / s180 H - s 300 / s 300 H - S 450 H
- Ultrasound cleaning controlled by microprocessors and Sweep technology with or without heating.
- Convenient LED display insuring comfortable data-reading.
Capacity:
From 2,75 to 28 Liters (other capacities on request)
- Ultrasounds Elmasonic S devices offer a lot of possibilities and a state-of-the-art technology. Equipments were studied to optimizethe efficiency of the ultrasounds.
- They have specific advantages to each business sectors:
- For laboratories ultrasounds allow to clean all glass, synthetic or metal instruments.
- For the medical sector, they allow an intensive prewash of devices, for the surgical instrumentation, the microcomputing instrumentation, the flexible endoscopic accessories and secondary endoscopes.
- For the dentalcare sector, they allow a cleaning of all the instruments and eliminates the cement
and the plaster, the forests, the false teeth and other prothetic accessories.
Equipment:
-Electronic setting of the temperature and of time.
-Automatic starting up according to the selected temperature.
-High-power transducers.
-Ceramic resistances protected against the dry step.
-Fast degassing with the button: �« Autodegas /Degas �».
-High cleaning performance thanks to �« Sweep technology �».
-Power interruption button.
It is a Micro & Macro HIFU Ultrasound Focus Ultrasound technology System , Professional for face lifting , skin tightening , and body contouring . ;)
There are 7 catridges with difference depth . ( 4 cartridges for face and other 3 cartridges for body )
1.5mm:targeting at the epidermis to improve superficial fine lines,skintone,skintexture,and fine pores.
3.0mm,aiming on the dermis to stimulate continuour regen eration of collagen.
4.5mm,cting on sama fascia layer to tighten the muscle bottom and achieve firmness
6.0mm,9.0mm,13.0mm,different layers of sectokill cellulite dissolve fat to gighten and shape, releasing curvaceous beauty
The 2.0mm cartridges is the original one in the world , and can be operated in all parts without restricted area . It can do more precise and more targeted treatment .
.Compare with the traditional HIFU , it reduce the Focus point diameter is 0.25mm , It means same energy with more smallers treatment point .
It also why the 7D hifu machine feeling is more comfortable and result is more better .
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