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Double-Ended Pogo Pin Test Probe Scfb029(40)

Supplier From China
Mar-04-22

Double-Ended Pogo Pin Test Probe SCFB029(40) for Chip Inspection

Semiconductor test probes are usually called double-ended pogo pins � Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

SCPB029(40) is unique in shape among semiconductor test probes due to a convex ring at one end of its barrel. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. �  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production � 

Its parameters are as below.
Materials (plated)
Barrel: Phosphor Bronze, Au on Ni Plated
Bottom Plunger: Beryllium Copper, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on NI Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 8.5 GHz@-1dB
Inductance: 1MHZ@-0.02661uH
Captance: 1MHZ@0.925374uF

Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.65 mm
Spring Force: 14 �±4 gf@load 0.65 mm
Mechanical Life: about 100000 cycles

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Welcome to browse our website and download any catalogs of our products. If you need a complete set of product manual, please feel free to contact us. Many products are not uploaded due to a huge range. If you can't find what you need, please feel free to contact us.

Notice:
Stock: standard product. As usual, they are in stock.
Express: DHL, FedEx, UPS, etc.
Payment: T/T, PayPal

Price and Minimum Quantity

Price: $0.1 - $50
MOQ: Not Specified

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The plunger can be pressed at a distance of up to 1.9 mm. But it is better to be pressed at a distance of 1.25 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 1.25 mm, the loaded force is about 12 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.
Materials (plated)
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Y: Top (Plunger 2): SK4, Au on Ni Plated
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Electronic Specification:
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Capacitive Reactance: 1MHZ at 0.329458 uF

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